DocumentCode
3556267
Title
Pulse doped MODFET´s
Author
Hueschen, Mark ; Moll, Nick ; Gowen, Elmer ; Miller, Jeff
Author_Institution
Hewlett-Packard Laboratories, Palo Alto, CA
Volume
30
fYear
1984
fDate
1984
Firstpage
348
Lastpage
351
Abstract
We have designed and fabricated a novel variation of the conventional modulation-doped heterostructure FET, based on growth by molecular beam epitaxy. The doping of the AlGaAs is confined to a thin layer, about 100Å thick, close to the heterointerface. This increases the forward voltage of the Schottky gate, reduces the dependence of threshold voltage on MBE growth parameters, allows the use of high doping levels without excessive gate leakage, and reduces trapping effects associated with silicon incorporation into AlGaAs. Extrinsic transconductances greater than 300 mS/mm and Ft ´s greater than 33 GHz (for a 0.8 µm gate length) have been measured at room temperature.
Keywords
Doping; Epitaxial layers; FETs; Gate leakage; HEMTs; MODFETs; Molecular beam epitaxial growth; Silicon; Temperature measurement; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1984 International
Type
conf
DOI
10.1109/IEDM.1984.190720
Filename
1484491
Link To Document