• DocumentCode
    3556267
  • Title

    Pulse doped MODFET´s

  • Author

    Hueschen, Mark ; Moll, Nick ; Gowen, Elmer ; Miller, Jeff

  • Author_Institution
    Hewlett-Packard Laboratories, Palo Alto, CA
  • Volume
    30
  • fYear
    1984
  • fDate
    1984
  • Firstpage
    348
  • Lastpage
    351
  • Abstract
    We have designed and fabricated a novel variation of the conventional modulation-doped heterostructure FET, based on growth by molecular beam epitaxy. The doping of the AlGaAs is confined to a thin layer, about 100Å thick, close to the heterointerface. This increases the forward voltage of the Schottky gate, reduces the dependence of threshold voltage on MBE growth parameters, allows the use of high doping levels without excessive gate leakage, and reduces trapping effects associated with silicon incorporation into AlGaAs. Extrinsic transconductances greater than 300 mS/mm and Ft´s greater than 33 GHz (for a 0.8 µm gate length) have been measured at room temperature.
  • Keywords
    Doping; Epitaxial layers; FETs; Gate leakage; HEMTs; MODFETs; Molecular beam epitaxial growth; Silicon; Temperature measurement; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1984 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1984.190720
  • Filename
    1484491