• DocumentCode
    3556335
  • Title

    Application of selective silicon epitaxial growth for CMOS technology

  • Author

    Nagao, S. ; Higashitani, K. ; Akasaka, Y. ; Nakata, H.

  • Author_Institution
    Mitsubishi Electric Corp., Itami, Japan
  • Volume
    30
  • fYear
    1984
  • fDate
    1984
  • Firstpage
    593
  • Lastpage
    596
  • Abstract
    This paper describes the application of selective epltaxial growth for device isolation. An improved selective epitaxial isolation technology is presented in the fabrication of CMOS LSI. This advanced process technology results in a superior selectivity for selective silicon deposition. CMOS ring-oscillator with a twin-well structure is fabricated by using this selective epitaxial isolation technology. In contrast to LOCOS technology, it is demonstrated that this technology is useful for scaled CMOS in eliminating lateral oxidation and successful overlapping contacts due to it´s steeper boundary of oxide-to-silicon isolation.
  • Keywords
    CMOS technology; Epitaxial growth; Epitaxial layers; Fabrication; Isolation technology; Large scale integration; Oxidation; Silicon; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1984 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1984.190790
  • Filename
    1484561