DocumentCode :
3556335
Title :
Application of selective silicon epitaxial growth for CMOS technology
Author :
Nagao, S. ; Higashitani, K. ; Akasaka, Y. ; Nakata, H.
Author_Institution :
Mitsubishi Electric Corp., Itami, Japan
Volume :
30
fYear :
1984
fDate :
1984
Firstpage :
593
Lastpage :
596
Abstract :
This paper describes the application of selective epltaxial growth for device isolation. An improved selective epitaxial isolation technology is presented in the fabrication of CMOS LSI. This advanced process technology results in a superior selectivity for selective silicon deposition. CMOS ring-oscillator with a twin-well structure is fabricated by using this selective epitaxial isolation technology. In contrast to LOCOS technology, it is demonstrated that this technology is useful for scaled CMOS in eliminating lateral oxidation and successful overlapping contacts due to it´s steeper boundary of oxide-to-silicon isolation.
Keywords :
CMOS technology; Epitaxial growth; Epitaxial layers; Fabrication; Isolation technology; Large scale integration; Oxidation; Silicon; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1984 International
Type :
conf
DOI :
10.1109/IEDM.1984.190790
Filename :
1484561
Link To Document :
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