DocumentCode :
355635
Title :
Modulation Z-scan technique in photorefractive crystals
Author :
Marquez Aguilar, P.A. ; Sanchez-Mondragon, Jose Javier ; Stepanov, S. ; Vyaloukh, V.
Author_Institution :
INAOE, Puebla, Mexico
fYear :
1996
fDate :
7-7 June 1996
Firstpage :
212
Lastpage :
213
Abstract :
Summary form only given. The Z-scan technique proved to be a quite simple method (it uses one laser beam only) for characterization of different optically nonlinear media. Recently this technique was also successively applied to photorefractive crystals (PRCs) Bi/sub 12/TiO/sub 20/ (BTO) under an external DC electric field. It was shown, however, that due to some point defects and inclusions that are typical for PRCs the standard Z-scan curves are characterized by a rather big spread of experimental points. Here we propose utilization of modulation version of this technique, which gives much better and more reproducible Z-scan curves in PRCs.
Keywords :
bismuth compounds; optical modulation; photorefractive materials; Bi/sub 12/TiO/sub 20/; DC electric field; inclusions; laser beam; modulation Z-scan technique; optically nonlinear medium; photorefractive crystal; point defects; Amplitude modulation; Crystals; Nonlinear optics; Optical modulation; Optical polarization; Optical refraction; Optimized production technology; Partial response channels; Photorefractive effect; Photorefractive materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-444-0
Type :
conf
Filename :
865789
Link To Document :
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