Title :
Session 3 Solid state devices — Hot-carrier effects
Author :
Hu, Chuanmin ; Sokel, R.
Author_Institution :
University of California, Berkeley, CA, USA
Abstract :
Start of the above-titled section of the conference proceedings.
Conference_Titel :
Electron Devices Meeting, 1985 International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/IEDM.1985.190887