• DocumentCode
    3556540
  • Title

    A new process for one micron and finer CMOS

  • Author

    Martin, Russel A. ; Lewis, Alan G. ; Huang, Tiao Y. ; Chen, John Y.

  • Author_Institution
    Xerox, Palo Alto Research Center, Palo Alto, CA
  • Volume
    31
  • fYear
    1985
  • fDate
    1985
  • Firstpage
    403
  • Lastpage
    406
  • Abstract
    We have demonstrated a new process architecture using retrograde N-wells which provides rigorous isolation and latch-up immunity at 3µm N+to P+spacing, while using straightforward LOCOS processing with self-aligned channel stops. Excellent transistor performance has been obtained. Twenty-three stage ring oscillators with and without LDD structure have been characterized.
  • Keywords
    Boron; CMOS logic circuits; CMOS process; CMOS technology; Implants; Isolation technology; Laboratories; Light scattering; Ring oscillators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1985 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1985.190986
  • Filename
    1485536