DocumentCode :
3556540
Title :
A new process for one micron and finer CMOS
Author :
Martin, Russel A. ; Lewis, Alan G. ; Huang, Tiao Y. ; Chen, John Y.
Author_Institution :
Xerox, Palo Alto Research Center, Palo Alto, CA
Volume :
31
fYear :
1985
fDate :
1985
Firstpage :
403
Lastpage :
406
Abstract :
We have demonstrated a new process architecture using retrograde N-wells which provides rigorous isolation and latch-up immunity at 3µm N+to P+spacing, while using straightforward LOCOS processing with self-aligned channel stops. Excellent transistor performance has been obtained. Twenty-three stage ring oscillators with and without LDD structure have been characterized.
Keywords :
Boron; CMOS logic circuits; CMOS process; CMOS technology; Implants; Isolation technology; Laboratories; Light scattering; Ring oscillators; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1985 International
Type :
conf
DOI :
10.1109/IEDM.1985.190986
Filename :
1485536
Link To Document :
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