Title :
Characterization of GaAs integrated circuits by direct electro-optic sampling
Author :
Weingarten, K.J. ; Rodwell, M.J.W. ; Freeman, J.L. ; Diamond, S.K. ; Bloom, D.M.
Author_Institution :
Stanford University, Stanford, California
Abstract :
With the recent demonstration of direct electro-optic sampling of GaAs circuits, a new method to characterize high-speed monolithic microwave and digital circuits exists. This technique uses picosecond pulses from a laser to non-invasively probe voltage waveforms at points internal to monolithic circuits with a measurement bandwidth in excess of 50 GHz. This paper presents measurements of a GaAs MESFET traveling wave amplifier and an 8-bit multiplexer/demultiplexer.
Keywords :
Digital circuits; Gallium arsenide; Lasers and electrooptics; Microwave circuits; Microwave theory and techniques; Optical pulses; Pulse amplifiers; Pulse circuits; Pulse measurements; Sampling methods;
Conference_Titel :
Electron Devices Meeting, 1985 International
DOI :
10.1109/IEDM.1985.191007
