Title :
Session 18 Integrated circuits — Modeling and analysis of MOS circuits
Author :
Noble, W. ; Cohen, Emmanuel
Author_Institution :
IBM Corporation
Abstract :
Start of the above-titled section of the conference proceedings.
Conference_Titel :
Electron Devices Meeting, 1985 International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/IEDM.1985.191009
