DocumentCode :
3556685
Title :
A 3.3-ps Josephson or gate with Niobium junctions
Author :
Kotani, S. ; Imamura, T. ; Hasuo, S.
Author_Institution :
Fujitsu Limited, Atsugi, Japan
Volume :
32
fYear :
1986
fDate :
1986
Firstpage :
93
Lastpage :
95
Abstract :
In this paper, we describe the design, fabrication, and evaluation of a Josephson logic gate with all-niobium junctions. Recently, we reported a 4.2-ps Modified Variable Threshold Logic (MVTL) OR gate. We redesigned the MVTL gate, in order to confirm the feasibility of its use as an ultra high speed gate. The minimum diameter of the Nb/AiOx/Nb junctions was reduced from 2.5 µm to 2.0 µm to decrease the junction capacitance. Resistance and inductance values were also optimized to attain high-speed operation. We evaluated an OR gate with a 5- stage gate chain by means of the Josephson sampling technique. The measured minimum gate delay was 3.3 ps/gate for a power consumption of 9.1 µW/gate.
Keywords :
Capacitance; Delay; Electrical resistance measurement; Fabrication; Inductance; Josephson junctions; Logic gates; Niobium; Power measurement; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1986 International
Type :
conf
DOI :
10.1109/IEDM.1986.191120
Filename :
1486378
Link To Document :
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