• DocumentCode
    3556685
  • Title

    A 3.3-ps Josephson or gate with Niobium junctions

  • Author

    Kotani, S. ; Imamura, T. ; Hasuo, S.

  • Author_Institution
    Fujitsu Limited, Atsugi, Japan
  • Volume
    32
  • fYear
    1986
  • fDate
    1986
  • Firstpage
    93
  • Lastpage
    95
  • Abstract
    In this paper, we describe the design, fabrication, and evaluation of a Josephson logic gate with all-niobium junctions. Recently, we reported a 4.2-ps Modified Variable Threshold Logic (MVTL) OR gate. We redesigned the MVTL gate, in order to confirm the feasibility of its use as an ultra high speed gate. The minimum diameter of the Nb/AiOx/Nb junctions was reduced from 2.5 µm to 2.0 µm to decrease the junction capacitance. Resistance and inductance values were also optimized to attain high-speed operation. We evaluated an OR gate with a 5- stage gate chain by means of the Josephson sampling technique. The measured minimum gate delay was 3.3 ps/gate for a power consumption of 9.1 µW/gate.
  • Keywords
    Capacitance; Delay; Electrical resistance measurement; Fabrication; Inductance; Josephson junctions; Logic gates; Niobium; Power measurement; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1986 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1986.191120
  • Filename
    1486378