DocumentCode
3556685
Title
A 3.3-ps Josephson or gate with Niobium junctions
Author
Kotani, S. ; Imamura, T. ; Hasuo, S.
Author_Institution
Fujitsu Limited, Atsugi, Japan
Volume
32
fYear
1986
fDate
1986
Firstpage
93
Lastpage
95
Abstract
In this paper, we describe the design, fabrication, and evaluation of a Josephson logic gate with all-niobium junctions. Recently, we reported a 4.2-ps Modified Variable Threshold Logic (MVTL) OR gate. We redesigned the MVTL gate, in order to confirm the feasibility of its use as an ultra high speed gate. The minimum diameter of the Nb/AiOx /Nb junctions was reduced from 2.5 µm to 2.0 µm to decrease the junction capacitance. Resistance and inductance values were also optimized to attain high-speed operation. We evaluated an OR gate with a 5- stage gate chain by means of the Josephson sampling technique. The measured minimum gate delay was 3.3 ps/gate for a power consumption of 9.1 µW/gate.
Keywords
Capacitance; Delay; Electrical resistance measurement; Fabrication; Inductance; Josephson junctions; Logic gates; Niobium; Power measurement; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1986 International
Type
conf
DOI
10.1109/IEDM.1986.191120
Filename
1486378
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