DocumentCode :
3556693
Title :
1800V bipolar-mode MOSFETs: A first application of silicon wafer direct bonding (SDB) technique to a power device
Author :
Nakagawa, Akio ; Watanabe, Kiminori ; Yamaguchi, Yoshihiro ; Ohashi, Hiromichi ; Furukawa, Kazuyoshi
Author_Institution :
Toshiba Research and Development Center, Kawasaki, Japan
Volume :
32
fYear :
1986
fDate :
1986
Firstpage :
122
Lastpage :
125
Abstract :
1800v and 1700v non-latch-up Bipolar-Mode MOSFETs have been developed, based on Silicon Wafer Direct Bonding (SDB) technique: a new substrate wafer fabrication process superior to conventional epitaxy. The SDB technique easily realizes an optimum N buffer structure as well as a high resistivity N-layer. Self-aligned deep P+diffusions, densified hole bypasses and an amorphous silicon resistive field plate have been implemented. 0.45µsec fall-time and more than 100A maximum current capability have been successfully realized.
Keywords :
Bipolar transistors; Conductivity; Epitaxial growth; Fabrication; MOSFETs; Mirrors; Silicon; Substrates; Voltage; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1986 International
Type :
conf
DOI :
10.1109/IEDM.1986.191128
Filename :
1486386
Link To Document :
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