• DocumentCode
    3556696
  • Title

    Trench transistor cell with self-aligned contact (TSAC) for megabit MOS DRAM

  • Author

    Yanagisawa, Masayuki ; Nakamura, Kunio ; Kikuchi, Masanori

  • Author_Institution
    NEC Corporation, Kanagawa, Japan
  • Volume
    32
  • fYear
    1986
  • fDate
    1986
  • Firstpage
    132
  • Lastpage
    135
  • Abstract
    A new one-transistor, one-capacitor MOS dynamic RAM cell structure called a Trench Transistor Cell with Self-Aligned Contact (TSAC) has been developed for 4M bit and beyond VLSI memory devices. Basic concept of the new cell structure is shrinkage of the conventional trench capacitor cell using the following technologies; (1) Trench transistor as a transfer gate, and (2) Bit line contact, which is self-aligned to the word line. Superior immunity of the trench transistor from short and narrow channel effects, combined with marginless contact design capability, enables substantial reduction of the memory cell size. Adopting submicron design rule, the new cell realizes extremely small cell size below 9 µm2. This enables reasonable size 4M bit chip, which can be encapsulated in a 300 mil DIP.
  • Keywords
    Capacitors; DRAM chips; Fabrication; Insulation; MOSFETs; Oxidation; Random access memory; Surface morphology; Transistors; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1986 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1986.191131
  • Filename
    1486389