Title :
New technologies in dual channel read-out registers for high-density CCD image sensor
Author :
Orihara, K. ; Oda, E.
Author_Institution :
NEC Corporation, Kawasaki, Japan
Abstract :
New technologies has been developed for dual channel read-out registers. The mechanism for fixed pattern noise, associated with charge transfer between two horizontal CCD registers, has been clarified and optimum design has been proposed. Furthermore, a new dual channel read-out technique has been developed.
Keywords :
Cameras; Charge coupled devices; Charge transfer; Charge-coupled image sensors; Clocks; Electrodes; Filters; Frequency; Image sensors; Registers;
Conference_Titel :
Electron Devices Meeting, 1986 International
DOI :
10.1109/IEDM.1986.191193
