DocumentCode
3556792
Title
Power and noise performance of the pseudomorphic modulation doped field effect transistor at 60 GHz
Author
Henderson, T. ; Aksun, M.I. ; Peng, C.K. ; Morkoc, H. ; Chao, P.C. ; Smith, P.M. ; Duh, K.H.G. ; Lester, L.F.
Author_Institution
University of Illinois, Urbana, IL
Volume
32
fYear
1986
fDate
1986
Firstpage
464
Lastpage
466
Abstract
Quarter micron gate length In0.15 Ga0.85 As/Al0.15 Ga0.55 As pseudomorphic modulation doped field effect transistors (MODFETs) were grown, fabricated, and characterized. These devices exhibit outstanding DC performance with excellent pinch-off characteristics, a relatively low output conductance for a quarter micron gate field effect transistor (FET), a high reverse breakdown voltage, and transconductances as high as 495 mS/mm at 300K. Furthermore, these devices show outstanding rf performance as well. At 18 GHz, a noise figure of 0.9 dB with an associated gain of 10.4 dB was observed, and at 62 GHz, the noise figure was 2.4 dB with an associated gain of 4.4 dB. Power measurements at 62.2 GHz indicate a maximum output power density of 0.43 W/mm (Vds = 6 V) with a power gain of 3 dB, and a maximum power added efficiency of 28%, an unprecedented value. When tuned a maximum available gain of 11.7 dB was obtained at 60 GHz implying a maximum frequency of oscillation near 250 GHz. From these results it is clear that the pseudomorphic MODFET represents a very attractive choice for operation near or above 60 GHz.
Keywords
Carrier confinement; Epitaxial layers; FETs; Frequency; Gain; Gallium arsenide; HEMTs; Indium gallium arsenide; MODFETs; Noise figure;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1986 International
Type
conf
DOI
10.1109/IEDM.1986.191220
Filename
1486478
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