Title :
Session 24 Device modeling beyond drift-plus-diffusion transport
Author_Institution :
IBM T.J. Watson Research Center, Yorktown Heights, NY
Abstract :
Start of the above-titled section of the conference proceedings.
Conference_Titel :
Electron Devices Meeting, 1986 International
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/IEDM.1986.191247
