Title :
Session 28 Solid-state devices — Advanced FETs and device reliability
Author :
Temple, Victor ; Alvarez, Alfredo
Author_Institution :
General Electric
Abstract :
Start of the above-titled section of the conference proceedings.
Conference_Titel :
Electron Devices Meeting, 1986 International
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/IEDM.1986.191270
