• DocumentCode
    3556847
  • Title

    Session 28 Solid-state devices — Advanced FETs and device reliability

  • Author

    Temple, Victor ; Alvarez, Alfredo

  • Author_Institution
    General Electric
  • fYear
    1986
  • fDate
    7-10 Dec. 1986
  • Firstpage
    633
  • Lastpage
    633
  • Abstract
    Start of the above-titled section of the conference proceedings.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1986 International
  • Conference_Location
    Los Angeles, CA, USA
  • Type

    conf

  • DOI
    10.1109/IEDM.1986.191270
  • Filename
    1486528
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3556847