DocumentCode :
3556872
Title :
Session 31 Solid-state devices — Hot carrier effects
Author :
Hsu, Fu-Hau ; Takeda, E.
Author_Institution :
IDT Corporation
fYear :
1986
fDate :
7-10 Dec. 1986
Firstpage :
717
Lastpage :
717
Abstract :
Start of the above-titled section of the conference proceedings.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1986 International
Conference_Location :
Los Angeles, CA, USA
Type :
conf
DOI :
10.1109/IEDM.1986.191293
Filename :
1486551
Link To Document :
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