• DocumentCode
    3556969
  • Title

    Novel device structures by selective epitaxial growth (SEG)

  • Author

    Borland, John O.

  • Volume
    33
  • fYear
    1987
  • fDate
    1987
  • Firstpage
    12
  • Lastpage
    15
  • Abstract
    In the last few years, great interest has been generated in the selective growth of single crystal silicon in seed windows of an SiO2mask in order to fabricate novel device structures for VLSI/ULSI device technology. This increased interest in selective epitaxial growth (SEG) and its derivitives, simultaneous single/poly deposition (SSPD) and epitaxial lateral overgrowth (ELO) have led to several key processing breakthroughs that are currently changing the future direction and usage of silicon epitaxy. This paper will describe: 1) the key SEG processing breakthroughs that have occurred over the last 25 years, 2) some of the current limitations still observed with SEG processing and, 3) some of the novel device structures that are possible through the use of SEG techniques.
  • Keywords
    BiCMOS integrated circuits; CMOS technology; Doping; Epitaxial growth; Isolation technology; Production; Random access memory; Scalability; Silicon on insulator technology; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1987 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1987.191335
  • Filename
    1487293