Title :
Session 16 Solid-state devices — Low temperature device operation
Author :
Gaensslen, F. ; Nelson, D.
Author_Institution :
IBM Thomas J. Watson Research Center
Abstract :
Start of the above-titled section of the conference proceedings.
Conference_Titel :
Electron Devices Meeting, 1987 International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/IEDM.1987.191436