DocumentCode :
3557079
Title :
Integration of superconducting technology for a 50 GHz sampling oscilloscope chip
Author :
Whiteley, S.R. ; Hanson, E.R. ; Hohenwater, G. K G ; Kuo, F. ; Faris, S.M.
Author_Institution :
Hypres, Inc., Elmsford, NY
Volume :
33
fYear :
1987
fDate :
1987
Firstpage :
380
Lastpage :
384
Abstract :
HYPRES, Inc. has introduced a Sampling Oscilloscope/Time Domain Reflectometer (TDR) based on Josephson junction technology to the commercial marketplace. The unit offers measurement performance commensurate with the inherent high speed of the Josephson elements, e.g., risetimes on the order of 8 ps. The Josephson circuitry is contained on a single 1.1 × 1.6 fused silica substrate and housed in an interchangeable measurement module. Only the portion of the chip which contains the superconducting circuitry is cooled with a coplanar transmission line providing the wide bandwidth interface between the room temperature and cryogenic environments less than 1cm apart.
Keywords :
Integrated circuit measurements; Josephson junctions; Measurement units; Oscilloscopes; Sampling methods; Semiconductor device measurement; Silicon compounds; Superconducting transmission lines; Transmission line measurements; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1987 International
Type :
conf
DOI :
10.1109/IEDM.1987.191437
Filename :
1487395
Link To Document :
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