DocumentCode
3557079
Title
Integration of superconducting technology for a 50 GHz sampling oscilloscope chip
Author
Whiteley, S.R. ; Hanson, E.R. ; Hohenwater, G. K G ; Kuo, F. ; Faris, S.M.
Author_Institution
Hypres, Inc., Elmsford, NY
Volume
33
fYear
1987
fDate
1987
Firstpage
380
Lastpage
384
Abstract
HYPRES, Inc. has introduced a Sampling Oscilloscope/Time Domain Reflectometer (TDR) based on Josephson junction technology to the commercial marketplace. The unit offers measurement performance commensurate with the inherent high speed of the Josephson elements, e.g., risetimes on the order of 8 ps. The Josephson circuitry is contained on a single 1.1 × 1.6 fused silica substrate and housed in an interchangeable measurement module. Only the portion of the chip which contains the superconducting circuitry is cooled with a coplanar transmission line providing the wide bandwidth interface between the room temperature and cryogenic environments less than 1cm apart.
Keywords
Integrated circuit measurements; Josephson junctions; Measurement units; Oscilloscopes; Sampling methods; Semiconductor device measurement; Silicon compounds; Superconducting transmission lines; Transmission line measurements; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1987 International
Type
conf
DOI
10.1109/IEDM.1987.191437
Filename
1487395
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