• DocumentCode
    3557079
  • Title

    Integration of superconducting technology for a 50 GHz sampling oscilloscope chip

  • Author

    Whiteley, S.R. ; Hanson, E.R. ; Hohenwater, G. K G ; Kuo, F. ; Faris, S.M.

  • Author_Institution
    Hypres, Inc., Elmsford, NY
  • Volume
    33
  • fYear
    1987
  • fDate
    1987
  • Firstpage
    380
  • Lastpage
    384
  • Abstract
    HYPRES, Inc. has introduced a Sampling Oscilloscope/Time Domain Reflectometer (TDR) based on Josephson junction technology to the commercial marketplace. The unit offers measurement performance commensurate with the inherent high speed of the Josephson elements, e.g., risetimes on the order of 8 ps. The Josephson circuitry is contained on a single 1.1 × 1.6 fused silica substrate and housed in an interchangeable measurement module. Only the portion of the chip which contains the superconducting circuitry is cooled with a coplanar transmission line providing the wide bandwidth interface between the room temperature and cryogenic environments less than 1cm apart.
  • Keywords
    Integrated circuit measurements; Josephson junctions; Measurement units; Oscilloscopes; Sampling methods; Semiconductor device measurement; Silicon compounds; Superconducting transmission lines; Transmission line measurements; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1987 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1987.191437
  • Filename
    1487395