DocumentCode
3557096
Title
High-performance low-temperature poly-Si TFTs for LCD
Author
Mimura, A. ; Konishi, N. ; Ono, K. ; Ohwada, J. ; Hosokawa, Y. ; Ono, Y.A. ; Suzuki, T. ; Miyata, K. ; Kawakami, H.
Author_Institution
Hitachi Limited, Hitachi, Ibaraki, Japan
Volume
33
fYear
1987
fDate
1987
Firstpage
436
Lastpage
439
Abstract
High-performance low-temperature poly-Si TFTs were developed by a 600°C process so that a glass substrate could be utilized. To achieve low threshold voltage (VTH ) and high field effect mobility (µFE ), effective hydrogenation using a thin poly-Si gate was employed. Furthermore, active layer poly-Si deposition conditions by LPCVD were optimized. Thinning the gate poly-Si was very effective in reducing VTH by hydrogenation. Crystallinity of poly-Si after therma annealing at 600°C depended closely on the poly-Si deposition temperature and was a maximum at 550-560°C. The developed TFTs, with poly-Si deposited at 550°C and a 1000 Å gate, had a VTH of 6.2 V and µFE of 37 cm2/V.s. These TFTs were successfully applied to LCDs with fully integrated drive circuits.
Keywords
Active matrix liquid crystal displays; Annealing; Circuits; Crystallization; Glass; Plasma temperature; Substrates; Temperature dependence; Thin film transistors; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1987 International
Type
conf
DOI
10.1109/IEDM.1987.191452
Filename
1487410
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