• DocumentCode
    3557111
  • Title

    Session 20 Modeling and simulation — Hot electron, current crowding, and alpha-particle models

  • Author

    Arledge, L. ; Shur, M.

  • Author_Institution
    Texas Instruments, Inc.
  • fYear
    1987
  • fDate
    6-9 Dec. 1987
  • Firstpage
    493
  • Lastpage
    493
  • Abstract
    Start of the above-titled section of the conference proceedings.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1987 International
  • Conference_Location
    Washington, DC, USA
  • Type

    conf

  • DOI
    10.1109/IEDM.1987.191467
  • Filename
    1487425