• DocumentCode
    3557147
  • Title

    High performance sample-and-hold implemented with GaAs/AlGaAs heterojunction bipolar transistor technology

  • Author

    Gorman, G.M. ; Camou, J.B. ; Oki, A.K. ; Oyama, B.K. ; Kim, M.E.

  • Author_Institution
    TRW Inc., Redondo Beach, CA
  • Volume
    33
  • fYear
    1987
  • fDate
    1987
  • Firstpage
    623
  • Lastpage
    626
  • Abstract
    A high-speed monolithic sample-and-hold (S/H) implemented with a GaAs/AlGaAs heterojunction bipolar transistor (HBT) IC technology is presented. This circuit is believed to be the first GaAs HBT S/H demonstrated. The S/H fabrication employs molecular-beam epitaxy and circuit integration with 3 µm emitter HBT, integrated Schottky diode, thin-film resistor, MIM capacitor, and double-level metal interconnect. S/H speed performance includes track bandwidth (-3 dB) of 1.8 GHz and sampled-mode analog bandwidth of 400 MHz at a sample rate of 800 Ms/s. The low frequency distortion (3rd harmonic) was at least -50 dBc for an input amplitude of 250 mV peak-to-peak. Preliminary test results indicate that the S/H has the potential for the accuracy required in 8-bit data conversion systems up to 400 Ms/s. Further development in processing is expected to improve both sampling rate and accuracy.
  • Keywords
    Bandwidth; Bipolar integrated circuits; Fabrication; Gallium arsenide; Heterojunction bipolar transistors; High speed integrated circuits; Integrated circuit technology; Molecular beam epitaxial growth; Monolithic integrated circuits; Schottky diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1987 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1987.191504
  • Filename
    1487462