• DocumentCode
    3557158
  • Title

    The field assisted turn-off thyristor: A regenerative device with voltage controlled turn-off

  • Author

    Petti, Christopher J. ; Plummer, James D.

  • Author_Institution
    Stanford University, Stanford, California
  • Volume
    33
  • fYear
    1987
  • fDate
    1987
  • Firstpage
    662
  • Lastpage
    665
  • Abstract
    A regenerative device with voltage controlled turn-off, the field assisted turn-off (FATO) thyristor, is described. This shorted-cathode device incorporates an MOS gate fabricated along the sidewall of a plasma-etched trench. When the thyristor is in the on state and a negative voltage is applied to this gate, holes are pulled from the electron-hole plasma towards the sidewall, travel up the sidewall and are collected by a P+region shorted to the cathode. To maintain charge neutrality, then, the N+cathode stops injecting electrons and the device comes out of regeneration. In this manner, the devices thus far fabricated can turn off a current density of 8 A/cm2in excess of the holding current. By ramping the voltage on the off gate more rapidly, a current density of 40 A/cm2in excess of the holding current can be turned off, with a displacement current through the off gate of 1/20 of the anode current in excess of the holding current.
  • Keywords
    Anodes; Cathodes; Current density; Laboratories; MOS devices; Plasma density; Plasma devices; Switches; Thyristors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1987 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1987.191515
  • Filename
    1487473