• DocumentCode
    3557170
  • Title

    Use of the work function distribution for cathode characterization

  • Author

    Shroff, A.M. ; Tonnerre, J.C. ; Lucas, P. ; Palluel, P. ; Brion, D.

  • Author_Institution
    THOMSON-CSF, Boulogne-Billancourt, France
  • Volume
    33
  • fYear
    1987
  • fDate
    1987
  • Firstpage
    705
  • Lastpage
    708
  • Abstract
    Due to a work function distribution which is not uniform over the cathode surface an abrupt transition is replaced by a smooth continuous variation that links the space charge curve to the temperature limited curve. From the standard deviation of the work function distribution one can deduce a quality factor of the cathode and the trend of its probable evolution. Evolution of σ calculated from aged cathodes can be plotted versus time. This leads to a quality estimate and survey of cathode evolution. The higher the σ the more exhausted the cathode is. This type of analysis has been used on cathodes during reactivation after the surface was argon sputter cleaned. It is then possible to follow the coverage evolution by correlating the results with Auger analysis.
  • Keywords
    Aging; Argon; Cathodes; Charge measurement; Current measurement; Density measurement; Q factor; Space charge; Temperature distribution; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1987 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1987.191527
  • Filename
    1487485