DocumentCode
3557215
Title
1 THz bandwidth probing of devices and integrated circuits
Author
Valdmanis, J.A. ; Nuss, M.C. ; Smith, P.R. ; Li, K.D. ; Pei, S.S.
Author_Institution
AT&T Bell Laboratories, Murray Hill, NJ
Volume
33
fYear
1987
fDate
1987
Firstpage
857
Lastpage
858
Keywords
Bandwidth; Circuits; Electric variables measurement; Electrooptic devices; Gallium arsenide; Laser modes; Optical pulse generation; Optical pulses; Sampling methods; Spatial resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1987 International
Type
conf
DOI
10.1109/IEDM.1987.191570
Filename
1487528
Link To Document