Title :
Thermal and electrical simulation of smart power circuits by network analysis
Author :
Teichmann, J. ; Kraus, W. ; Liebermann, F. ; Taschner, G. ; Wallner, C.
Author_Institution :
Atmel, Heilbronn, Germany
Abstract :
A Spectre-based method is described for complex electrical-thermal simulations of smart power circuits. The packaged circuit of a system is divided into numerous small columns. They form a large electrical representation of the thermal network. The electrical circuit sends the dissipated power to the thermal network and receives the temperature. All transistors of the system have individual temperatures. An EKV transistor model with temperature input and power output is used. Transient simulations and measurements are compared.
Keywords :
circuit analysis computing; circuit simulation; integrated circuit modelling; power integrated circuits; EKV transistor model; Spectre-based method; electrical-thermal simulations; network analysis; packaged circuit; smart power circuits; transient simulations; Analytical models; Circuit analysis; Circuit simulation; Driver circuits; Packaging; Resistance heating; Silicon; Temperature; Thermal conductivity; Thermal resistance;
Conference_Titel :
Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on
Print_ISBN :
0-7803-8890-9
DOI :
10.1109/ISPSD.2005.1487968