DocumentCode :
3557413
Title :
Thermal and electrical simulation of smart power circuits by network analysis
Author :
Teichmann, J. ; Kraus, W. ; Liebermann, F. ; Taschner, G. ; Wallner, C.
Author_Institution :
Atmel, Heilbronn, Germany
fYear :
2005
fDate :
23-26 May 2005
Firstpage :
131
Lastpage :
134
Abstract :
A Spectre-based method is described for complex electrical-thermal simulations of smart power circuits. The packaged circuit of a system is divided into numerous small columns. They form a large electrical representation of the thermal network. The electrical circuit sends the dissipated power to the thermal network and receives the temperature. All transistors of the system have individual temperatures. An EKV transistor model with temperature input and power output is used. Transient simulations and measurements are compared.
Keywords :
circuit analysis computing; circuit simulation; integrated circuit modelling; power integrated circuits; EKV transistor model; Spectre-based method; electrical-thermal simulations; network analysis; packaged circuit; smart power circuits; transient simulations; Analytical models; Circuit analysis; Circuit simulation; Driver circuits; Packaging; Resistance heating; Silicon; Temperature; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on
Print_ISBN :
0-7803-8890-9
Type :
conf
DOI :
10.1109/ISPSD.2005.1487968
Filename :
1487968
Link To Document :
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