• DocumentCode
    3557455
  • Title

    1200 V-Class 4H-SiC RESURF MOSFETs with Low On-Resistances

  • Author

    Kimoto, T. ; Kawano, H. ; Suda, J.

  • fYear
    2005
  • fDate
    23-26 May 2005
  • Firstpage
    279
  • Lastpage
    282
  • Keywords
    Annealing; Avalanche breakdown; Fabrication; Implants; MOSFETs; Oxidation; Rough surfaces; Silicon carbide; Surface roughness; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on
  • Print_ISBN
    0-7803-8890-9
  • Type

    conf

  • DOI
    10.1109/ISPSD.2005.1488005
  • Filename
    1488005