DocumentCode
3557467
Title
Two-stage Hot Carrier Degradation of LDMOS Transistors.
Author
Moens, P. ; Bauwens, F. ; Thomason, M.
fYear
2005
fDate
23-26 May 2005
Firstpage
323
Lastpage
326
Keywords
Ambient intelligence; Birds; CMOS process; CMOS technology; Charge pumps; Degradation; Hot carriers; Semiconductor device modeling; Semiconductor optical amplifiers; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on
Print_ISBN
0-7803-8890-9
Type
conf
DOI
10.1109/ISPSD.2005.1488016
Filename
1488016
Link To Document