DocumentCode :
3557530
Title :
Intentional hydrogen doping of polycrystalline ZnO thin films prepared by MOCVD technique
Author :
Myong, Seung Yeop ; Lim, Koeng Su
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear :
2005
fDate :
3-7 Jan. 2005
Firstpage :
148
Lastpage :
151
Abstract :
We investigated the role of hydrogen impurities in polycrystalline ZnO incorporated via post-deposition hydrogen exposure. From the room-temperature infrared absorption spectra, photoluminescent spectra, and electrical stability measurements under air atmosphere, we concluded that hydrogen interstitials act as shallow donors and decrease oxygen and Zn vacancies.
Keywords :
II-VI semiconductors; MOCVD; hydrogen; impurities; infrared spectra; interstitials; photoluminescence; semiconductor doping; semiconductor thin films; vacancies (crystal); wide band gap semiconductors; zinc compounds; MOCVD technique; Zn vacancy decrease; ZnO:H; air atmosphere; electrical stability measurements; hydrogen impurities; hydrogen interstitials; intentional hydrogen doping; oxygen vacancy decrease; photoluminescent spectra; polycrystalline ZnO thin films; post-deposition hydrogen exposure; room-temperature infrared absorption spectra; shallow donors; Atmospheric measurements; Doping; Electromagnetic wave absorption; Hydrogen; Impurities; Infrared spectra; MOCVD; Stability; Transistors; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
ISSN :
0160-8371
Print_ISBN :
0-7803-8707-4
Type :
conf
DOI :
10.1109/PVSC.2005.1488091
Filename :
1488091
Link To Document :
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