LBIC analysis of thin-film polycrystalline solar cells

Author

Sites, James R. ; Nagle, Timothy J.

Author_Institution

Phys. Dept., Colorado State Univ., Fort Collins, CO, USA

fYear

2005

fDate

3-7 Jan. 2005

Firstpage

199

Lastpage

204

Abstract

Light-beam-induced-current (LBIC) measurements are providing a direct link between the spatial non-uniformities inherent in thin-film polycrystalline solar cells, such as CdTe and CIGS, and the overall performance of these cells. LBIC is uniquely equipped to produce quantitative maps of local quantum efficiency with relative ease. Spatial resolution of 1 m at 1-sun intensity, and return to the same area after other measurements, is routinely achieved. A wavelength range of 638 to 857 nm is available with diode lasers. The LBIC measurements demonstrate that several types of effects that alter cell performance can be traced to specific local-area features. Examples of such effects include defects related to edges, grids, or scribes, spatial variations in alloying, and local changes due to high-temperature stress.

Keywords

OBIC; solar cells; 638 to 857 nm; LBIC analysis; alloying; cell performance; diode lasers; grids; high-temperature stress; light-beam-induced-current analysis; local quantum efficiency; local-area features; scribes; spatial nonuniformity; spatial resolution; thin-film polycrystalline solar cells; Diode lasers; Laser beams; Laser modes; Mirrors; Optical modulation; Photoconductivity; Photovoltaic cells; Physics; Transistors; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE

ISSN

0160-8371

Print_ISBN

0-7803-8707-4

Type

conf

DOI

10.1109/PVSC.2005.1488104

Filename

1488104