• DocumentCode
    3557545
  • Title

    Interfaces in thin film solar cells

  • Author

    Klein, Andreas ; Jaegermann, W. ; Hunger, Ralf ; Kraft, Daniel ; Sauberlich, F. ; Schulmeyer, T. ; Spath, B.

  • Author_Institution
    Surface Sci. Div., Darmstadt Technol. Univ., Germany
  • fYear
    2005
  • fDate
    3-7 Jan. 2005
  • Firstpage
    205
  • Lastpage
    210
  • Abstract
    Interfaces are important for the efficiencies of thin film solar cells. In particular, for polycrystalline chalcogenide semiconductors as CdTe and Cu(In,Ga)(S,Se)2 (CIGS) the existing physical concepts, which describe the electronic properties of elemental or III-V compound semiconductor interfaces quite well, are not sufficient. The increased complexity is mostly due to the non-abruptness of the interfaces and the strong tendency for the formation of defects in the more polar bonded II-VI compounds. Photoelectron spectroscopy has significantly contributed to the understanding of the mechanisms governing the properties of semiconductor interfaces in thin film solar cells. The experimental approach using integrated surface analysis and thin film deposition systems and selected results will be presented.
  • Keywords
    II-VI semiconductors; cadmium compounds; copper compounds; crystal defects; gallium compounds; indium compounds; interface structure; photoelectron spectra; semiconductor thin films; solar cells; ternary semiconductors; CdTe; Cu(InGa)(SSe)2; III-V compound semiconductor interfaces; defect formation; electronic properties; integrated surface analysis; photoelectron spectroscopy; polar bonded II-VI compounds; polycrystalline chalcogenide semiconductors; thin film deposition system; thin film solar cell interfaces; Bonding; Glass; Heterojunctions; Materials science and technology; Photovoltaic cells; Semiconductor materials; Semiconductor thin films; Spectroscopy; Substrates; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488105
  • Filename
    1488105