Title :
deposition and characterization of wide band gap CuGaSe2 thin films and solar cells
Author :
Yun, Jae Ha ; Chalapathy, R.B.V. ; Kim, Seok Ki ; Lee, Jeong Chul ; Song, Jinsoo ; Ahn, Byung Tae ; Yoon, Kyung Hoon
Author_Institution :
Solar Cells Res. Center, Korea Inst. of Energy Res., Daejeon, South Korea
Abstract :
CuGaSe2 absorber layers were grown by evaporating elemental Cu, Ga and Se on molybdenum coated soda lime glass substrates using three-stage process with substrate temperature monitoring. The grain size of the films decreased with the increase of Ga composition, but the morphology of the films improved. The optical band gap of the absorbers is around 1.68 eV regardless of Ga concentration. Using these films the solar cells with a structure SLG/Mo/CuGaSe2/CdS/ZnO/AI were fabricated. Current-voltage characteristics and spectral response measurements were performed to evaluate device parameters and to analyze loss factors. In optimal condition, the absorber film is 1.9 μm thick and slightly Ga rich bulk composition [Cu]/[Ga] =0.88 and we obtained VOC = 0.81 V, JSC = 11.9 mA, ff =0.635 and η = 6.1 %.
Keywords :
copper compounds; current density; energy gap; gallium compounds; grain size; semiconductor thin films; short-circuit currents; solar absorber-convertors; solar cells; surface morphology; ternary semiconductors; thin film devices; vacuum deposited coatings; vacuum deposition; wide band gap semiconductors; 0.81 V; 1.9 mum; 11.9 mA; CuGaSe2 absorber layers; Ga composition; Mo-CuGaSe2-CdS-ZnO-Al; current-voltage characteristics; device parameters; evaporation; film morphology; grain size; loss factors; molybdenum coated soda lime glass substrates; optical band gap; solar cells; spectral response measurements; substrate temperature monitoring; thin film deposition; three-stage process; wide band gap CuGaSe2 thin films; Glass; Grain size; Morphology; Optical films; Photonic band gap; Photovoltaic cells; Substrates; Temperature measurement; Temperature sensors; Wideband;
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
Print_ISBN :
0-7803-8707-4
DOI :
10.1109/PVSC.2005.1488165