DocumentCode
3557648
Title
Analysis of EOL prediction methodology for triple-junction solar cells in actual radiation environment
Author
Sumita, Taishi ; Imaizumi, Mitsuru ; Ohshima, Takeshi ; ltoh, H. ; Kuwajima, Saburou
Author_Institution
Japan Aerosp. Exploration Agency, Ibaraki, Japan
fYear
2005
fDate
3-7 Jan. 2005
Firstpage
667
Lastpage
670
Abstract
We investigated an optimal methodology for predicting end-of-life performance of triple-junction space solar cells using two major prediction methods (JPL and NRL produced). Neither prediction method could be applied to proton degradation after the current-limiting cell change, while electron degradation can be predicted using both methods even if the change occurred. The prediction methodology for an actual radiation environment was proposed based on the combinational irradiations by protons and electrons.
Keywords
III-V semiconductors; electron beam effects; elemental semiconductors; environmental degradation; gallium arsenide; gallium compounds; germanium; indium compounds; life testing; proton effects; semiconductor heterojunctions; solar cells; EOL prediction methodology; InGaP-GaAs-Ge; actual radiation environment; combinational proton-electron irradiation; current-limiting cell change; electron degradation; end-of-life prediction methodology; proton degradation; triple-junction space solar cells; Acceleration; Degradation; Electrons; Laboratories; Performance analysis; Photovoltaic cells; Prediction methods; Protons; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
ISSN
0160-8371
Print_ISBN
0-7803-8707-4
Type
conf
DOI
10.1109/PVSC.2005.1488219
Filename
1488219
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