• DocumentCode
    3557648
  • Title

    Analysis of EOL prediction methodology for triple-junction solar cells in actual radiation environment

  • Author

    Sumita, Taishi ; Imaizumi, Mitsuru ; Ohshima, Takeshi ; ltoh, H. ; Kuwajima, Saburou

  • Author_Institution
    Japan Aerosp. Exploration Agency, Ibaraki, Japan
  • fYear
    2005
  • fDate
    3-7 Jan. 2005
  • Firstpage
    667
  • Lastpage
    670
  • Abstract
    We investigated an optimal methodology for predicting end-of-life performance of triple-junction space solar cells using two major prediction methods (JPL and NRL produced). Neither prediction method could be applied to proton degradation after the current-limiting cell change, while electron degradation can be predicted using both methods even if the change occurred. The prediction methodology for an actual radiation environment was proposed based on the combinational irradiations by protons and electrons.
  • Keywords
    III-V semiconductors; electron beam effects; elemental semiconductors; environmental degradation; gallium arsenide; gallium compounds; germanium; indium compounds; life testing; proton effects; semiconductor heterojunctions; solar cells; EOL prediction methodology; InGaP-GaAs-Ge; actual radiation environment; combinational proton-electron irradiation; current-limiting cell change; electron degradation; end-of-life prediction methodology; proton degradation; triple-junction space solar cells; Acceleration; Degradation; Electrons; Laboratories; Performance analysis; Photovoltaic cells; Prediction methods; Protons; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488219
  • Filename
    1488219