DocumentCode
3557818
Title
Reliability of Components
Author
Forrester, Jay W.
Volume
5
Issue
4
fYear
1983
Firstpage
399
Lastpage
401
Abstract
Because this issue of the Annals focuses on the SAGE system, the following excerpt from Christopher Evans´s 1975 interview with Jay W. Forrester is timely. Editor´s Note: Jay Forrester is one of the great pioneers of the computer business: director of Digital Computer Laboratory at MIT, builder of Whirlwind, inventor of core memory, and chief engineer for SAGE. His accomplishments are too numerous to mention, but this brief excerpt from an interview shows us something of his attitude toward design.
Keywords
Circuit noise; Circuit testing; Computer architecture; Information processing; Power system reliability; Power system transients; Printed circuits; Reliability; Vacuum technology;
fLanguage
English
Journal_Title
Annals of the History of Computing
Publisher
ieee
ISSN
0164-1239
Type
jour
DOI
10.1109/MAHC.1983.10099
Filename
4640774
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