Title :
Diagnosing ADC nonlinearity at the bit level
Author :
Wagdy, Mahmoud Fawzy
Author_Institution :
Dept. of Electr. Eng., Lowell Univ., MA, USA
fDate :
12/1/1989 12:00:00 AM
Abstract :
Two methods for identifying analog-to-digital converter (ADC) nonlinearity at the bit level are discussed. The integral nonlinearity (INL) is analyzed in the frequency domain using both DFT and Walsh transforms to determine which ADC bit is responsible for which harmonic or bin. It is shown that the effects of different bits on the outputs of either transform are separable. A 5-bit ADC example is investigated using both transforms to illustrate the implementation of the techniques
Keywords :
analogue-digital conversion; electron device testing; fast Fourier transforms; network analysis; transforms; ADC nonlinearity; DFT; Walsh transforms; analog-to-digital converter; frequency domain; harmonic; integral nonlinearity; Distortion measurement; Failure analysis; Frequency domain analysis; Harmonic analysis; Harmonic distortion; Helium; Histograms; Sampling methods; Spectral analysis; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Conference_Location :
12/1/1989 12:00:00 AM