DocumentCode
3557880
Title
Diagnosing ADC nonlinearity at the bit level
Author
Wagdy, Mahmoud Fawzy
Author_Institution
Dept. of Electr. Eng., Lowell Univ., MA, USA
Volume
38
Issue
6
fYear
1989
fDate
12/1/1989 12:00:00 AM
Firstpage
1139
Lastpage
1141
Abstract
Two methods for identifying analog-to-digital converter (ADC) nonlinearity at the bit level are discussed. The integral nonlinearity (INL) is analyzed in the frequency domain using both DFT and Walsh transforms to determine which ADC bit is responsible for which harmonic or bin. It is shown that the effects of different bits on the outputs of either transform are separable. A 5-bit ADC example is investigated using both transforms to illustrate the implementation of the techniques
Keywords
analogue-digital conversion; electron device testing; fast Fourier transforms; network analysis; transforms; ADC nonlinearity; DFT; Walsh transforms; analog-to-digital converter; frequency domain; harmonic; integral nonlinearity; Distortion measurement; Failure analysis; Frequency domain analysis; Harmonic analysis; Harmonic distortion; Helium; Histograms; Sampling methods; Spectral analysis; Testing;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
Conference_Location
12/1/1989 12:00:00 AM
ISSN
0018-9456
Type
jour
DOI
10.1109/19.46415
Filename
46415
Link To Document