DocumentCode :
3558148
Title :
Gunn oscillations in thin GaAs epilayers and m.e.s.f.e.t.s
Author :
Tsironis, C. ; Dekkers, J.J.M.
Author_Institution :
Philips, Laboratoires d´´Electronique et de Physique Appliqu?ƒ?©e, Limeil-Br?ƒ?©vannes, France
Volume :
127
Issue :
5
fYear :
1980
fDate :
10/1/1980 12:00:00 AM
Firstpage :
241
Lastpage :
249
Abstract :
Oscillations due to travelling Gunn domains have been observed in gated and ungated GaAs m.e.s.f.e.t.s (channels) made on v.p.e. and l.p.e. active layers. The doping was 1-2 × 1017 cm ¿3 and the thickness 0.1-0.2 ¿m. In channels with non-negative I/V slope the oscillators were possible only with pulsed bias and decayed 1¿3 ns after switching on the bias. In f.e.t.s the oscillations were self sustained, delivered approximately 60 ¿W r.f. power on 50 ¿ and their frequency in the range 16¿27 GHz was predicted, as in the channels, by the length of the drain to source gap, The domain formation is sensitive on the cross section of the epilayer and the microstructure of the ohmic contacts.
Keywords :
Gunn effect; III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; semiconductor epitaxial layers; vapour phase epitaxial growth; GaAs epitaxial layers; Gunn oscillations; III-V semiconductor; LPE; MESFET; VPE; ohmic contacts;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Proceedings I
Publisher :
iet
Conference_Location :
10/1/1980 12:00:00 AM
ISSN :
0143-7100
Type :
jour
DOI :
10.1049/ip-i-1.1980.0049
Filename :
4642517
Link To Document :
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