DocumentCode
3558157
Title
Use of VOC/JSC measurements for determination of barrier height under illumination and for fill-factor calculations in Schottky-barrier solar cells
Author
Panayotatos, P. ; Card, H.C.
Author_Institution
Columbia University, Department of Electrical Engineering, New York, USA
Volume
127
Issue
6
fYear
1980
fDate
12/1/1980 12:00:00 AM
Firstpage
308
Lastpage
311
Abstract
An experimental study has been made of metal-silicon solar cells, with thin Ag, Au, Cu, Fe and In electrodes. No intentional interfacial layers were introduced and the silicon surfaces were chemically prepared in such a way as to minimise the residual oxide layer. The characteristics of the devices were taken at various illumination levels and the effect of barrier height, series resistance and n-value on the open-circuit voltage and the fill factor were studied. Comparison between theoretical predictions and the experimental results show that Voc/Jsc measurements that provide the n-values appropriate for the expression for the open-circuit voltage also provide a reliable method for experimental barrier-height determination under illumination and that the above `true¿ n-value should also be used in fill-factor calculations.
Keywords
Schottky effect; current density; elemental semiconductors; short-circuit currents; silicon; solar cells; Ag; Au; Cu; Fe; In; MIS structures; Schottky barrier; Schottky barrier solar cells; barrier height; fill factor; illumination levels; interfacial layers; metal-Si solar cells; open circuit voltage; series resistance; short circuit current density;
fLanguage
English
Journal_Title
Solid-State and Electron Devices, IEE Proceedings I
Publisher
iet
Conference_Location
12/1/1980 12:00:00 AM
ISSN
0143-7100
Type
jour
DOI
10.1049/ip-i-1.1980.0060
Filename
4642529
Link To Document