• DocumentCode
    3558157
  • Title

    Use of VOC/JSC measurements for determination of barrier height under illumination and for fill-factor calculations in Schottky-barrier solar cells

  • Author

    Panayotatos, P. ; Card, H.C.

  • Author_Institution
    Columbia University, Department of Electrical Engineering, New York, USA
  • Volume
    127
  • Issue
    6
  • fYear
    1980
  • fDate
    12/1/1980 12:00:00 AM
  • Firstpage
    308
  • Lastpage
    311
  • Abstract
    An experimental study has been made of metal-silicon solar cells, with thin Ag, Au, Cu, Fe and In electrodes. No intentional interfacial layers were introduced and the silicon surfaces were chemically prepared in such a way as to minimise the residual oxide layer. The characteristics of the devices were taken at various illumination levels and the effect of barrier height, series resistance and n-value on the open-circuit voltage and the fill factor were studied. Comparison between theoretical predictions and the experimental results show that Voc/Jsc measurements that provide the n-values appropriate for the expression for the open-circuit voltage also provide a reliable method for experimental barrier-height determination under illumination and that the above `true¿ n-value should also be used in fill-factor calculations.
  • Keywords
    Schottky effect; current density; elemental semiconductors; short-circuit currents; silicon; solar cells; Ag; Au; Cu; Fe; In; MIS structures; Schottky barrier; Schottky barrier solar cells; barrier height; fill factor; illumination levels; interfacial layers; metal-Si solar cells; open circuit voltage; series resistance; short circuit current density;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • Conference_Location
    12/1/1980 12:00:00 AM
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1980.0060
  • Filename
    4642529