DocumentCode :
3558175
Title :
Circuit switching analysis for optically excited metal-insulator (tunnel)-silicon thyristor (MIST)
Author :
Moustakas, S. ; Dell, J.M. ; Calligaro ; Nassibian, A.G. ; Hullett, J.L.
Author_Institution :
University of Western Australia, Department of Electrical & Electronic Engineering, Perth, Australia
Volume :
128
Issue :
3
fYear :
1981
fDate :
6/1/1981 12:00:00 AM
Firstpage :
92
Lastpage :
96
Abstract :
A simple equivalent circuit is employed to model the optically induced switching conditions of the MIST, thereby permitting the delay time, rise time and fall time to be calculated. The model also enables easy examination of the dependence of the MIST´s transient behaviour to both optical power overdrive and device capacitance and resistance. Experimental verification of the theory is undertaken.
Keywords :
equivalent circuits; metal-insulator-semiconductor devices; photoelectric devices; semiconductor device models; semiconductor switches; thyristors; capacitance; circuit switching analysis; delay time; equivalent circuit; fall time; model; optical power overdrive; optically induced metal-insulator-Si thyristor; resistance; rise time; semiconductor device models; transient behaviour;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Proceedings I
Publisher :
iet
Conference_Location :
6/1/1981 12:00:00 AM
ISSN :
0143-7100
Type :
jour
DOI :
10.1049/ip-i-1.1981.0027
Filename :
4642564
Link To Document :
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