DocumentCode :
3558180
Title :
Calculated performance of monolithic hot-electron transistors
Author :
Shannon, J.M.
Author_Institution :
Philips, Research Laboratories, Redhill, UK
Volume :
128
Issue :
4
fYear :
1981
fDate :
8/1/1981 12:00:00 AM
Firstpage :
134
Lastpage :
140
Abstract :
The properties of monolithic hot-electron transistors, together with structures required to obtain optimum performance, are described. It is calculated that, in principle, structures in Si and GaAs can be made with delay times ¿ 1 ps, while maintaining useful emitter and collector barriers capable of injecting and collecting electrons with energies well above the conduction band edge in the base. Assuming that the characteristic length for energy loss in these materials is similar, it is calculated that it should be possible to make transistors having FT and FMAX> 100 GHz with power delay products ¿ 1 fJ.
Keywords :
III-V semiconductors; bipolar transistors; elemental semiconductors; gallium arsenide; hot carriers; silicon; GaAs; III-V semiconductor; Si; bipolar transistor; camel diode; conduction band edge; delay times; elemental semiconductor; monolithic hot-electron transistors;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Proceedings I
Publisher :
iet
Conference_Location :
8/1/1981 12:00:00 AM
ISSN :
0143-7100
Type :
jour
DOI :
10.1049/ip-i-1.1981.0035
Filename :
4642573
Link To Document :
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