DocumentCode :
3558196
Title :
Simple model and study of charge handling and injection in charge-coupled devices
Author :
Ferguson, R.S. ; Ryan, W.D.
Author_Institution :
Queen´s University of Belfast, Department of Engineering Mathematics, Ashby Institute, Belfast, UK
Volume :
128
Issue :
6
fYear :
1981
fDate :
12/1/1981 12:00:00 AM
Firstpage :
218
Lastpage :
224
Abstract :
An accurate simulation of charge transport in a charge-coupled device requires estimate to be made of fringing and self-induced fields. This has involved a two-dimensional solution for the potential distribution in the substrate, which can be expensive on computing time. The algorithm presented here restricts the calculation to a single set of nodal points along the surface of the device, and has been shown to be significantly faster, with little error, when compared with the corresponding two-dimensional solution. An attempt has also been made to obtain a simpler description of charge transport along the channel which avoids some of the problems which arise in the solution of the highly nonlinear transport equation. The simulation of two cases relevant to the operation of the CCD transfer process are presented. A study of injection from a source diffusion is also included.
Keywords :
charge-coupled devices; semiconductor device models; CCD transfer process; algorithm; charge handling; charge injection; charge transport; charge-coupled devices; fringing field; model; nodal points; self-induced fields; semiconductor device model; simulation; source diffusion;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Proceedings I
Publisher :
iet
Conference_Location :
12/1/1981 12:00:00 AM
ISSN :
0143-7100
Type :
jour
DOI :
10.1049/ip-i-1.1981.0053
Filename :
4642593
Link To Document :
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