• DocumentCode
    3558198
  • Title

    CASMOS-an accurate MOS model with geometry-dependent parameters: I

  • Author

    Oakley, R.E. ; Hocking, R.J.

  • Author_Institution
    Plessey Research (Caswell) Ltd., Allen Clark Research Centre, Towcester, UK
  • Volume
    128
  • Issue
    6
  • fYear
    1981
  • fDate
    12/1/1981 12:00:00 AM
  • Firstpage
    239
  • Lastpage
    247
  • Abstract
    The overall objective of this work has been to identify an MOS model that would meet the needs of circuit designers for CAD, and for which the parameters were easily derived and could be related to process variables, and so contribute to process control. The models in SPICE and MOSAID were evaluated but found unsatisfactory. A new model, CASMOS, has been developed which accurately represents MOS devices over a wide range of geometries with a set of 17 parameters. The equations are simple and economical in CPU time. The parameters can be easily and unambiguously extracted from electrical measurements and can be related to process data. The AC model is an improved version of the Ward and Dutton model, featuring charge conservation and a more accurate representation of CGD in saturation. Continuity of charge from region to region is guaranteed so that charge pumping is suppressed. CASMOS has been incorporated into SPICE and used for circuit simulation. Results of transistor characteristics are presented to demonstrate the accuracy of the DC model and of a ring oscillator to demonstrate the AC model.
  • Keywords
    circuit CAD; insulated gate field effect transistors; metal-insulator-semiconductor devices; semiconductor device models; AC model; CAD; CASMOS; DC model; MOS model; MOS transistor; MOSFET; SPICE; circuit simulation; geometry-dependent parameters; ring oscillator; transistor characteristics;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • Conference_Location
    12/1/1981 12:00:00 AM
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1981.0055
  • Filename
    4642595