• DocumentCode
    3558221
  • Title

    High-magnetic-field Van der Pauw method Magnetoresistance measurement and applications

  • Author

    Marion, D. ; Cristoloveanu, S. ; Chovet, A.

  • Author_Institution
    ENSERG, Institut National Polytechnique de Grenoble, Laboratoire de Physique des Composants ?ƒ\xa0 Semiconducteurs, Grenoble, France
  • Volume
    129
  • Issue
    4
  • fYear
    1982
  • fDate
    8/1/1982 12:00:00 AM
  • Firstpage
    125
  • Lastpage
    130
  • Abstract
    The paper develops a simple theory to account for the magnetoresistance influence on Van der Pauw-type experiments (i.e. resistivity and Hall coefficient RH measurements in arbitrarily shaped samples). In particular, it is proved that the voltage developed between two nonsuccessive contacts includes not only the usual Hall term (involving the magnetic field and RH) but also an additional term proportional to the magnetoresistance coefficient. This term is especially important under high magnetic fields and in anisotropic or ambipolar semiconductors; if ignored, it will be responsible for misleading interpretations of the Hall coefficient behaviour. Moreover, the influence of contact dimensions is shown to result mainly in an erroneous term, proportional to the Hall voltage. In this new light averaging techniques, suitable for more accurate measurements, are proposed. The experimental results fully support the theoretical derivations. As an application, a powerful method for the characterisation of ambipolar semiconductor slabs with arbitrary geometry is presented.
  • Keywords
    Hall effect; III-V semiconductors; elemental semiconductors; germanium; indium antimonide; magnetoresistance; semiconductors; Ge; Hall coefficient; InSb; ambipolar semiconductors; anisotropic semiconductors; arbitrarily shaped samples; averaging techniques; high magnetic field Van der Pauw method; influence of contact dimensions; magnetoresistance measurement; resistivity;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • Conference_Location
    8/1/1982 12:00:00 AM
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1982.0027
  • Filename
    4642626