• DocumentCode
    3558223
  • Title

    Monte Carlo simulation of submicron GaAs n+ -i(n)-n+ diode

  • Author

    Tomizawa ; Awano, Y. ; Hashizume, N. ; Kawashima, M.

  • Author_Institution
    Electrotechnical Laboratory of Japan, Niihari, Japan
  • Volume
    129
  • Issue
    4
  • fYear
    1982
  • fDate
    8/1/1982 12:00:00 AM
  • Firstpage
    131
  • Lastpage
    136
  • Abstract
    Monte Carlo simulation of electron transport in a GaAs diode, of n+ -i(n)-n+ structure, with a 0.25 μm - or 0.5 μm -long active layer is described. The anode voltage ranges from 0.25 V to 1.0 V. The distributions of electron energies and electron velocities, and the profiles of the electron density, electric field, potential, and average electron velocity are computed. Based on these data, the near ballistic nature of the electron transport in the 0.25μm-long diode and the importance of the back-scattering of electrons from the anode n+ -layer are discussed. Also, the effects of the lattice temperature and doping on the length of the active layer, and a comparison with a Si diode are discussed.
  • Keywords
    III-V semiconductors; Monte Carlo methods; carrier density; gallium arsenide; semiconductor device models; semiconductor diodes; Monte Carlo simulation; active layer length; anode n+-layer; anode voltage; average electron velocity; doping effects; electric field; electron backscattering; electron density; electron energies; electron transport; electron velocities; lattice temperature effects; model; near ballistic nature; potential; semiconductor diode; submicron GaAs n+-i(n)-n+ diode; Semiconductor devices and materials, Diodes, Simulation;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • Conference_Location
    8/1/1982 12:00:00 AM
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1982.0029
  • Filename
    4642628