DocumentCode
3558223
Title
Monte Carlo simulation of submicron GaAs n+ -i(n)-n+ diode
Author
Tomizawa ; Awano, Y. ; Hashizume, N. ; Kawashima, M.
Author_Institution
Electrotechnical Laboratory of Japan, Niihari, Japan
Volume
129
Issue
4
fYear
1982
fDate
8/1/1982 12:00:00 AM
Firstpage
131
Lastpage
136
Abstract
Monte Carlo simulation of electron transport in a GaAs diode, of n+ -i(n)-n+ structure, with a 0.25 μm - or 0.5 μm -long active layer is described. The anode voltage ranges from 0.25 V to 1.0 V. The distributions of electron energies and electron velocities, and the profiles of the electron density, electric field, potential, and average electron velocity are computed. Based on these data, the near ballistic nature of the electron transport in the 0.25μm-long diode and the importance of the back-scattering of electrons from the anode n+ -layer are discussed. Also, the effects of the lattice temperature and doping on the length of the active layer, and a comparison with a Si diode are discussed.
Keywords
III-V semiconductors; Monte Carlo methods; carrier density; gallium arsenide; semiconductor device models; semiconductor diodes; Monte Carlo simulation; active layer length; anode n+-layer; anode voltage; average electron velocity; doping effects; electric field; electron backscattering; electron density; electron energies; electron transport; electron velocities; lattice temperature effects; model; near ballistic nature; potential; semiconductor diode; submicron GaAs n+-i(n)-n+ diode; Semiconductor devices and materials, Diodes, Simulation;
fLanguage
English
Journal_Title
Solid-State and Electron Devices, IEE Proceedings I
Publisher
iet
Conference_Location
8/1/1982 12:00:00 AM
ISSN
0143-7100
Type
jour
DOI
10.1049/ip-i-1.1982.0029
Filename
4642628
Link To Document