DocumentCode :
3558231
Title :
Direct-gap group IV semiconductors based on tin
Author :
Goodman, Prof C H L
Author_Institution :
Standard Telecommunication Laboratories Ltd., Harlow, UK
Volume :
129
Issue :
5
fYear :
1982
fDate :
10/1/1982 12:00:00 AM
Firstpage :
189
Lastpage :
192
Abstract :
The MBE growth on InSb (and CdTe) of thin films of tin with diamond structure led to two unexpected findings: (i) photovoltaic behaviour suggesting an energy gap of 0.12eV, (ii) stabilisation of the diamond structure to about 70°C (compared with 13°C for bulk material). One explanation of semiconductivity is a strain-induced splitting of the Groves-Paul degeneracy which has been taken to confer semimetallic behaviour. Alternatively, if less probably, MBE material is free from Hg contamination (present in almost all earlier material), and Hg could act as both donor (interstitial) and acceptor (substitutional), which could compensate to give quasi-gap-bridging impurity bands in an intrinsically semiconducting material. Piezoresistance or other band measurements sensitive to band symmetry on MBE ¿-Sn are urgently needed to clarify the situation. The substrate stabilisation effect suggests that it could also be possible to stabilise films of the previously unknown (Sn, Ge) solid solutions by using appropriate substrates, e.g. InAs for compositions near Sn0.5Ge0.5 Such material could have considerable device interest: a direct gap of about 0.3 eV should be paired with higher carrier mobility (because of absence of polar scattering) than III-V or II-VI materials with a similar gap.
Keywords :
band structure; elemental semiconductors; molecular beam epitaxial growth; semiconductor epitaxial layers; tin; CdTe substrate; Groves-Paul degeneracy; InSb substrate; MBE growth; alpha Sn; band structure; diamond structure; direct gap group IV semiconductor; energy gap; grey Sn; strain-induced splitting; substrate stabilisation effect; thin films;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Proceedings I
Publisher :
iet
Conference_Location :
10/1/1982 12:00:00 AM
ISSN :
0143-7100
Type :
jour
DOI :
10.1049/ip-i-1.1982.0043
Filename :
4642643
Link To Document :
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