• DocumentCode
    3558253
  • Title

    Two-dimensional finite-element simulation of a permeable-base transistor

  • Author

    Marty, A. ; Clarac, J. ; Bailbe, J.P. ; Rey, G.

  • Author_Institution
    Centre National de la Recherche Scientifique, Laboratoire d´´Automatique et d´´Analyse des Syst?ƒ??mes, Toulouse, France
  • Volume
    130
  • Issue
    1
  • fYear
    1983
  • fDate
    2/1/1983 12:00:00 AM
  • Firstpage
    24
  • Lastpage
    28
  • Abstract
    Permeable-base-transistor modelling in two dimensions by the finite-element method is reported. The results of the applications presented demonstrate the capabilities of this simulation.
  • Keywords
    bipolar transistors; finite element analysis; semiconductor device models; I-V characteristics; PBT; current gains; cut-off frequency; electrical characteristics; finite element method; geometrical parameter; impurity concentration; model; numerical simulation; permeable-base transistor; transconductance; two-dimensional analysis;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • Conference_Location
    2/1/1983 12:00:00 AM
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1983.0005
  • Filename
    4642672