• DocumentCode
    3558254
  • Title

    Empirical model for gallium arsenide MESFETs

  • Author

    Brown, D.J.

  • Author_Institution
    Plessey Research (Caswell) Ltd., Allen Clark Research Centre, Towcester, UK
  • Volume
    130
  • Issue
    1
  • fYear
    1983
  • fDate
    2/1/1983 12:00:00 AM
  • Firstpage
    29
  • Lastpage
    32
  • Abstract
    The paper describes an accurate nonlinear model for GaAs MESFETs suitable for inclusion in general circuit simulation programs such as SPICE. To run efficiently, programs such as SPICE require simple models that can be described by as few parameters as possible, yet still meeting the accuracy criteria, and it is for this reason that an entirely empirical approach has been taken. The DC model for drain current is defined by seven parameters, with a further six defining the MES diode equations and the basic capacitance model. The model has been implemented in SPICE, and several characteristics are produced to indicate model accuracy.
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; semiconductor device models; DC model; GaAs MESFET; SPICE; capacitance; circuit simulation programs; drain current; empirical model; nonlinear model;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • Conference_Location
    2/1/1983 12:00:00 AM
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1983.0006
  • Filename
    4642673