DocumentCode :
3558254
Title :
Empirical model for gallium arsenide MESFETs
Author :
Brown, D.J.
Author_Institution :
Plessey Research (Caswell) Ltd., Allen Clark Research Centre, Towcester, UK
Volume :
130
Issue :
1
fYear :
1983
fDate :
2/1/1983 12:00:00 AM
Firstpage :
29
Lastpage :
32
Abstract :
The paper describes an accurate nonlinear model for GaAs MESFETs suitable for inclusion in general circuit simulation programs such as SPICE. To run efficiently, programs such as SPICE require simple models that can be described by as few parameters as possible, yet still meeting the accuracy criteria, and it is for this reason that an entirely empirical approach has been taken. The DC model for drain current is defined by seven parameters, with a further six defining the MES diode equations and the basic capacitance model. The model has been implemented in SPICE, and several characteristics are produced to indicate model accuracy.
Keywords :
III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; semiconductor device models; DC model; GaAs MESFET; SPICE; capacitance; circuit simulation programs; drain current; empirical model; nonlinear model;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Proceedings I
Publisher :
iet
Conference_Location :
2/1/1983 12:00:00 AM
ISSN :
0143-7100
Type :
jour
DOI :
10.1049/ip-i-1.1983.0006
Filename :
4642673
Link To Document :
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