DocumentCode
3558649
Title
Comments on "A method to predict an average activation energy for subassemblies" [with reply]
Author
Fieselman, C.D. ; Seager, J.D.
Volume
38
Issue
5
fYear
1989
Firstpage
563
Lastpage
564
Abstract
The commenter claims that there are certain limitations and inaccuracies in the above-named work (see ibid., vol.37, p.458-61, Dec. 1988) by J.D. Seager and C.D. Fieselman. In replying, Seager and Fieselman state that there are no inaccuracies in their work.<>
Keywords
failure analysis; reliability; acceleration factor; average activation energy; reliability; subassemblies; Acceleration; Circuit testing; Equations; Humidity; Integrated circuit modeling; Integrated circuit testing; Life estimation; Power dissipation; Temperature; Thermal stresses;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.46480
Filename
46480
Link To Document