Title :
Temperature-compensated sapphire resonator for ultra-stable oscillator capability at temperatures above 77 K
Author :
Dick, G. John ; Santiago, David G. ; Wang, Rabi T.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
We report on the design and test of a whispering gallery sapphire resonator for which the dominant (WGH/sub n11/) microwave mode family shows frequency-stable, compensated operation for temperatures above 77 K. The resonator makes possible a new ultra-stable oscillator (USO) capability that promises performance improvements over the best available crystal quartz oscillators in a compact cryogenic package. A mechanical compensation mechanism, enabled by the difference between copper and sapphire expansion coefficients, tunes the resonator to cancel the temperature variation of sapphire´s dielectric constant. In experimental tests, the WGH/sub 811/ mode showed a frequency turnover temperature of 87 K in agreement with finite element calculations. Preliminary tests of oscillator operation show an Allan Deviation of frequency variation of 1.4-6/spl times/10/sup -12/ for measuring times 1 s /spl les//spl tau//spl les/100 s with unstabilized resonator housing temperature and a mode Q of 2/spl times/10/sup 6/. We project a frequency stability 10/sup -14/ for this resonator with stabilized housing temperature and with a mode Q of 10/sup 7/.<>
Keywords :
circuit stability; compensation; cryogenic electronics; crystal oscillators; crystal resonators; frequency stability; microwave oscillators; sapphire; 6.6 to 10.75 GHz; 87 K; Al/sub 2/O/sub 3/-Cu; Allan deviation; WGH/sub 811/ mode; compact cryogenic package; dominant microwave mode family; frequency stability; frequency turnover temperature; mechanical compensation mechanism; mode Q; resonator tuning; sapphire dielectric constant; stabilized housing temperature; temperature-compensated sapphire resonator; thermal expansion coefficients; ultra-stable oscillator; whispering gallery sapphire resonator; Copper; Cryogenics; Dielectric constant; Dielectric measurements; Finite element methods; Frequency; Microwave oscillators; Packaging; Temperature; Testing;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on