Title :
Optimal testing-policies for intermittent faults
Author :
Nakagawa, Toshio ; Yasui, Kazumi
Author_Institution :
Dept. of Ind. Eng., Aichi Inst. of Technol., Toyota, Japan
fDate :
12/1/1989 12:00:00 AM
Abstract :
Periodic tests for intermittent faults are scheduled at times kT (k=1, 2, . . .). The mean number of tests and the mean time to detect faults are derived. Optimal testing times to minimize the mean cost and to maximize the probabilities of detecting the first fault are discussed. Both perfect and imperfect test models are discussed
Keywords :
failure analysis; fault location; reliability theory; testing; imperfect test models; intermittent faults; mean number of tests; mean time to detect faults; optimal testing policies; perfect test models; periodic tests; reliability; Computer aided instruction; Cost function; Digital systems; Error correction; Error correction codes; Fault detection; Hardware; Personnel; Reliability theory; System testing;
Journal_Title :
Reliability, IEEE Transactions on
Conference_Location :
12/1/1989 12:00:00 AM
