DocumentCode :
3558694
Title :
ITC 2008 Highlights
Author :
Touba, Nur A.
Author_Institution :
University of Texas at Austin
Volume :
25
Issue :
5
fYear :
2008
Firstpage :
398
Lastpage :
399
Keywords :
Automatic test pattern generation; Crosstalk; Design for testability; Materials testing; Microprocessors; Power dissipation; Power system management; Software testing; Supply chain management; System testing;
fLanguage :
English
Journal_Title :
Design Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.144
Filename :
4648418
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3558694
