DocumentCode :
3558703
Title :
CEDA Currents
Volume :
25
Issue :
5
fYear :
2008
Firstpage :
500
Lastpage :
502
Keywords :
CMOS technology; Circuits; Clocks; Computer interfaces; Electronic design automation and methodology; Hardware; High level synthesis; Random access memory; Testing; User interfaces;
fLanguage :
English
Journal_Title :
Design Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.136
Filename :
4648435
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3558703